The field of lighting is undergoing significant, even disruptive, changes in technology with solid-state lighting (SSL) entering the market. These new SSL devices require newer, advanced characterization and measurement methods.
The CIE/USA, the U.S. National Committee of the International Commission on Illumination (CIE), is offering a one-day series of seminars on November 10, 2010 in Toronto on the photometry, colorimetry, and application of solid-state lighting. Invited experts will present basic concepts, advanced techniques, and state of the art research on the characterization and measurement of light and lighting, along with discussions of international lighting recommendations for roadway lighting and issues of vision and health.
Scheduled speakers include Dr. Cameron Miller, NIST; Dr. Yoshi Ohno, NIST; Dr. Wendy Davis, NIST; Dr. Ronald Gibbons, VTTI; Dr. Rolf Bergman, Rolf Bergman Consulting; Mr. Terry McGowan, IDA; Mr. Philip Wychorski, Orion Standards LLC. This event is scheduled in conjunction with the 2010 IES Annual Conference at the same venue.
Further details including the registration form and how to make reservations at the hotel The Fairmont – Royal York Hotel the site of the meeting are available at www.cie-usnc.org